From patchwork Fri May 15 20:56:27 2020 Content-Type: text/plain; charset="utf-8" MIME-Version: 1.0 Content-Transfer-Encoding: 7bit X-Patchwork-Submitter: Alex Hung X-Patchwork-Id: 1291634 Return-Path: X-Original-To: incoming@patchwork.ozlabs.org Delivered-To: patchwork-incoming@bilbo.ozlabs.org Authentication-Results: ozlabs.org; spf=none (no SPF record) smtp.mailfrom=lists.ubuntu.com (client-ip=91.189.94.19; helo=huckleberry.canonical.com; envelope-from=fwts-devel-bounces@lists.ubuntu.com; receiver=) Authentication-Results: ozlabs.org; dmarc=fail (p=none dis=none) header.from=canonical.com Received: from huckleberry.canonical.com (huckleberry.canonical.com [91.189.94.19]) (using TLSv1.2 with cipher ECDHE-RSA-AES256-GCM-SHA384 (256/256 bits)) (No client certificate requested) by ozlabs.org (Postfix) with ESMTPS id 49P1152SbVz9sTH; Sat, 16 May 2020 06:56:40 +1000 (AEST) Received: from localhost ([127.0.0.1] helo=huckleberry.canonical.com) by huckleberry.canonical.com with esmtp (Exim 4.86_2) (envelope-from ) id 1jZhNl-0002BR-Iu; Fri, 15 May 2020 20:56:37 +0000 Received: from youngberry.canonical.com ([91.189.89.112]) by huckleberry.canonical.com with esmtps (TLS1.2:ECDHE_RSA_AES_128_GCM_SHA256:128) (Exim 4.86_2) (envelope-from ) id 1jZhNg-0002Az-4A for fwts-devel@lists.ubuntu.com; Fri, 15 May 2020 20:56:32 +0000 Received: from 2.general.alexhung.us.vpn ([10.172.65.255] helo=canonical.com) by youngberry.canonical.com with esmtpsa (TLS1.2:ECDHE_RSA_AES_128_GCM_SHA256:128) (Exim 4.86_2) (envelope-from ) id 1jZhNf-0006EB-HD; Fri, 15 May 2020 20:56:31 +0000 From: Alex Hung To: fwts-devel@lists.ubuntu.com Subject: [PATCH 1/2] acpi/method: add tests for _MAT method Date: Fri, 15 May 2020 14:56:27 -0600 Message-Id: <20200515205628.1039962-1-alex.hung@canonical.com> X-Mailer: git-send-email 2.25.1 MIME-Version: 1.0 X-BeenThere: fwts-devel@lists.ubuntu.com X-Mailman-Version: 2.1.20 Precedence: list List-Id: Firmware Test Suite Development List-Unsubscribe: , List-Archive: List-Post: List-Help: List-Subscribe: , Errors-To: fwts-devel-bounces@lists.ubuntu.com Sender: "fwts-devel" Signed-off-by: Alex Hung Acked-by: Colin Ian King Acked-by: Ivan Hu --- src/acpi/method/method.c | 10 ++++++++-- 1 file changed, 8 insertions(+), 2 deletions(-) diff --git a/src/acpi/method/method.c b/src/acpi/method/method.c index 0bf376fd..b7e9177c 100644 --- a/src/acpi/method/method.c +++ b/src/acpi/method/method.c @@ -132,7 +132,7 @@ * _LSI Y * _LSR N * _LSW N - * _MAT N + * _MAT Y * _MBM Y * _MLS Y * _MSG Y @@ -874,6 +874,12 @@ static int method_test_CRS(fwts_framework *fw) "_CRS", NULL, 0, method_test_CRS_return, "_CRS"); } +static int method_test_MAT(fwts_framework *fw) +{ + return method_evaluate_method(fw, METHOD_OPTIONAL, + "_MAT", NULL, 0, fwts_method_test_buffer_return, NULL); +} + static int method_test_PRS(fwts_framework *fw) { /* Re-use the _CRS checking on the returned buffer */ @@ -5627,7 +5633,7 @@ static fwts_framework_minor_test method_tests[] = { { method_test_GSB, "Test _GSB (Global System Interrupt Base)." }, { method_test_HPP, "Test _HPP (Hot Plug Parameters)." }, /* { method_test_HPX, "Test _HPX (Hot Plug Extensions)." }, */ - /* { method_test_MAT, "Test _MAT (Multiple APIC Table Entry)." }, */ + { method_test_MAT, "Test _MAT (Multiple APIC Table Entry)." }, { method_test_PRS, "Test _PRS (Possible Resource Settings)." }, { method_test_PRT, "Test _PRT (PCI Routing Table)." }, { method_test_PXM, "Test _PXM (Proximity)." }, From patchwork Fri May 15 20:56:28 2020 Content-Type: text/plain; charset="utf-8" MIME-Version: 1.0 Content-Transfer-Encoding: 7bit X-Patchwork-Submitter: Alex Hung X-Patchwork-Id: 1291635 Return-Path: X-Original-To: incoming@patchwork.ozlabs.org Delivered-To: patchwork-incoming@bilbo.ozlabs.org Authentication-Results: ozlabs.org; spf=none (no SPF record) smtp.mailfrom=lists.ubuntu.com (client-ip=91.189.94.19; helo=huckleberry.canonical.com; envelope-from=fwts-devel-bounces@lists.ubuntu.com; receiver=) Authentication-Results: ozlabs.org; dmarc=fail (p=none dis=none) header.from=canonical.com Received: from huckleberry.canonical.com (huckleberry.canonical.com [91.189.94.19]) (using TLSv1.2 with cipher ECDHE-RSA-AES256-GCM-SHA384 (256/256 bits)) (No client certificate requested) by ozlabs.org (Postfix) with ESMTPS id 49P11C1SbBz9sTM; Sat, 16 May 2020 06:56:47 +1000 (AEST) Received: from localhost ([127.0.0.1] helo=huckleberry.canonical.com) by huckleberry.canonical.com with esmtp (Exim 4.86_2) (envelope-from ) id 1jZhNs-0002CT-Ns; Fri, 15 May 2020 20:56:44 +0000 Received: from youngberry.canonical.com ([91.189.89.112]) by huckleberry.canonical.com with esmtps (TLS1.2:ECDHE_RSA_AES_128_GCM_SHA256:128) (Exim 4.86_2) (envelope-from ) id 1jZhNj-0002BL-U6 for fwts-devel@lists.ubuntu.com; Fri, 15 May 2020 20:56:35 +0000 Received: from 2.general.alexhung.us.vpn ([10.172.65.255] helo=canonical.com) by youngberry.canonical.com with esmtpsa (TLS1.2:ECDHE_RSA_AES_128_GCM_SHA256:128) (Exim 4.86_2) (envelope-from ) id 1jZhNi-0006EH-MY; Fri, 15 May 2020 20:56:35 +0000 From: Alex Hung To: fwts-devel@lists.ubuntu.com Subject: [PATCH 2/2] fwts-test: sync up with _MAT method tests Date: Fri, 15 May 2020 14:56:28 -0600 Message-Id: <20200515205628.1039962-2-alex.hung@canonical.com> X-Mailer: git-send-email 2.25.1 In-Reply-To: <20200515205628.1039962-1-alex.hung@canonical.com> References: <20200515205628.1039962-1-alex.hung@canonical.com> MIME-Version: 1.0 X-BeenThere: fwts-devel@lists.ubuntu.com X-Mailman-Version: 2.1.20 Precedence: list List-Id: Firmware Test Suite Development List-Unsubscribe: , List-Archive: List-Post: List-Help: List-Subscribe: , Errors-To: fwts-devel-bounces@lists.ubuntu.com Sender: "fwts-devel" Signed-off-by: Alex Hung Acked-by: Colin Ian King Acked-by: Ivan Hu --- fwts-test/method-0001/method-0001.log | 1093 +++++++++++++------------ 1 file changed, 549 insertions(+), 544 deletions(-) diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log index cb63f8c0..34fab0e4 100644 --- a/fwts-test/method-0001/method-0001.log +++ b/fwts-test/method-0001/method-0001.log @@ -1,41 +1,41 @@ method method: ACPI DSDT Method Semantic tests. method ---------------------------------------------------------- -method Test 1 of 201: Test Method Names. +method Test 1 of 202: Test Method Names. method Found 1061 Objects method PASSED: Test 1, Method names contain legal characters. method -method Test 2 of 201: Test _AEI. +method Test 2 of 202: Test _AEI. method SKIPPED: Test 2, Skipping test for non-existent object method _AEI. method -method Test 3 of 201: Test _EVT (Event Method). +method Test 3 of 202: Test _EVT (Event Method). method SKIPPED: Test 3, Skipping test for non-existent object method _EVT. method -method Test 4 of 201: Test _DLM (Device Lock Mutex). +method Test 4 of 202: Test _DLM (Device Lock Mutex). method SKIPPED: Test 4, Skipping test for non-existent object method _DLM. method -method Test 5 of 201: Test _PIC (Inform AML of Interrupt Model). +method Test 5 of 202: Test _PIC (Inform AML of Interrupt Model). method PASSED: Test 5, \_PIC returned no values as expected. method PASSED: Test 5, \_PIC returned no values as expected. method PASSED: Test 5, \_PIC returned no values as expected. method -method Test 6 of 201: Test _CID (Compatible ID). +method Test 6 of 202: Test _CID (Compatible ID). method PASSED: Test 6, \_SB_.PCI0._CID returned an integer method 0x030ad041 (EISA ID PNP0A03). method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an method integer 0x010cd041 (EISA ID PNP0C01). method -method Test 7 of 201: Test _CLS (Class Code). +method Test 7 of 202: Test _CLS (Class Code). method SKIPPED: Test 7, Skipping test for non-existent object method _CLS. method -method Test 8 of 201: Test _DDN (DOS Device Name). +method Test 8 of 202: Test _DDN (DOS Device Name). method SKIPPED: Test 8, Skipping test for non-existent object method _DDN. method -method Test 9 of 201: Test _HID (Hardware ID). +method Test 9 of 202: Test _HID (Hardware ID). method PASSED: Test 9, \_SB_.AMW0._HID returned a string method 'PNP0C14' as expected. method PASSED: Test 9, \_SB_.LID0._HID returned an integer @@ -89,31 +89,31 @@ method integer 0x0303d041 (EISA ID PNP0303). method PASSED: Test 9, \_SB_.PCI0.LPCB.PS2M._HID returned an method integer 0x130fd041 (EISA ID PNP0F13). method -method Test 10 of 201: Test _HRV (Hardware Revision Number). +method Test 10 of 202: Test _HRV (Hardware Revision Number). method SKIPPED: Test 10, Skipping test for non-existent object method _HRV. method -method Test 11 of 201: Test _MLS (Multiple Language String). +method Test 11 of 202: Test _MLS (Multiple Language String). method SKIPPED: Test 11, Skipping test for non-existent object method _MLS. method -method Test 12 of 201: Test _PLD (Physical Device Location). +method Test 12 of 202: Test _PLD (Physical Device Location). method SKIPPED: Test 12, Skipping test for non-existent object method _PLD. method -method Test 13 of 201: Test _SUB (Subsystem ID). +method Test 13 of 202: Test _SUB (Subsystem ID). method SKIPPED: Test 13, Skipping test for non-existent object method _SUB. method -method Test 14 of 201: Test _SUN (Slot User Number). +method Test 14 of 202: Test _SUN (Slot User Number). method SKIPPED: Test 14, Skipping test for non-existent object method _SUN. method -method Test 15 of 201: Test _STR (String). +method Test 15 of 202: Test _STR (String). method SKIPPED: Test 15, Skipping test for non-existent object method _STR. method -method Test 16 of 201: Test _UID (Unique ID). +method Test 16 of 202: Test _UID (Unique ID). method PASSED: Test 16, \_SB_.AMW0._UID correctly returned sane method looking value 0x00000000. method PASSED: Test 16, \_SB_.PCI0.PDRC._UID correctly returned @@ -139,11 +139,11 @@ method returned sane looking value 0x00000002. method PASSED: Test 16, \_SB_.PCI0.LPCB.BAT1._UID correctly method returned sane looking value 0x00000001. method -method Test 17 of 201: Test _CDM (Clock Domain). +method Test 17 of 202: Test _CDM (Clock Domain). method SKIPPED: Test 17, Skipping test for non-existent object method _CDM. method -method Test 18 of 201: Test _CRS (Current Resource Settings). +method Test 18 of 202: Test _CRS (Current Resource Settings). method PASSED: Test 18, \_SB_.PCI0._CRS (WORD Address Space method Descriptor) looks sane. method PASSED: Test 18, \_SB_.PCI0.PDRC._CRS (32-bit Fixed @@ -187,11 +187,11 @@ method Descriptor) looks sane. method PASSED: Test 18, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ method Descriptor) looks sane. method -method Test 19 of 201: Test _DSD (Device Specific Data). +method Test 19 of 202: Test _DSD (Device Specific Data). method SKIPPED: Test 19, Skipping test for non-existent object method _DSD. method -method Test 20 of 201: Test _DIS (Disable). +method Test 20 of 202: Test _DIS (Disable). method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._DIS returned no method values as expected. method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._DIS returned no @@ -209,432 +209,436 @@ method values as expected. method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._DIS returned no method values as expected. method -method Test 21 of 201: Test _DMA (Direct Memory Access). +method Test 21 of 202: Test _DMA (Direct Memory Access). method SKIPPED: Test 21, Skipping test for non-existent object method _DMA. method -method Test 22 of 201: Test _FIX (Fixed Register Resource +method Test 22 of 202: Test _FIX (Fixed Register Resource method Provider). method SKIPPED: Test 22, Skipping test for non-existent object method _FIX. method -method Test 23 of 201: Test _GSB (Global System Interrupt Base). +method Test 23 of 202: Test _GSB (Global System Interrupt Base). method SKIPPED: Test 23, Skipping test for non-existent object method _GSB. method -method Test 24 of 201: Test _HPP (Hot Plug Parameters). +method Test 24 of 202: Test _HPP (Hot Plug Parameters). method SKIPPED: Test 24, Skipping test for non-existent object method _HPP. method -method Test 25 of 201: Test _PRS (Possible Resource Settings). -method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ +method Test 25 of 202: Test _MAT (Multiple APIC Table Entry). +method SKIPPED: Test 25, Skipping test for non-existent object +method _MAT. +method +method Test 26 of 202: Test _PRS (Possible Resource Settings). +method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ +method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKC._PRS (IRQ +method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKC._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKD._PRS (IRQ +method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKD._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKE._PRS (IRQ +method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKE._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKF._PRS (IRQ +method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKF._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKG._PRS (IRQ +method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKG._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ +method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ method Descriptor) looks sane. method -method Test 26 of 201: Test _PRT (PCI Routing Table). -method PASSED: Test 26, \_SB_.PCI0._PRT correctly returned a sane +method Test 27 of 202: Test _PRT (PCI Routing Table). +method PASSED: Test 27, \_SB_.PCI0._PRT correctly returned a sane method looking package. -method PASSED: Test 26, \_SB_.PCI0.PEGP._PRT correctly returned a +method PASSED: Test 27, \_SB_.PCI0.PEGP._PRT correctly returned a method sane looking package. -method PASSED: Test 26, \_SB_.PCI0.RP01._PRT correctly returned a +method PASSED: Test 27, \_SB_.PCI0.RP01._PRT correctly returned a method sane looking package. -method PASSED: Test 26, \_SB_.PCI0.RP02._PRT correctly returned a +method PASSED: Test 27, \_SB_.PCI0.RP02._PRT correctly returned a method sane looking package. -method PASSED: Test 26, \_SB_.PCI0.RP03._PRT correctly returned a +method PASSED: Test 27, \_SB_.PCI0.RP03._PRT correctly returned a method sane looking package. -method PASSED: Test 26, \_SB_.PCI0.RP04._PRT correctly returned a +method PASSED: Test 27, \_SB_.PCI0.RP04._PRT correctly returned a method sane looking package. -method PASSED: Test 26, \_SB_.PCI0.RP05._PRT correctly returned a +method PASSED: Test 27, \_SB_.PCI0.RP05._PRT correctly returned a method sane looking package. -method PASSED: Test 26, \_SB_.PCI0.RP06._PRT correctly returned a +method PASSED: Test 27, \_SB_.PCI0.RP06._PRT correctly returned a method sane looking package. -method PASSED: Test 26, \_SB_.PCI0.PCIB._PRT correctly returned a +method PASSED: Test 27, \_SB_.PCI0.PCIB._PRT correctly returned a method sane looking package. method -method Test 27 of 201: Test _PXM (Proximity). -method SKIPPED: Test 27, Skipping test for non-existent object +method Test 28 of 202: Test _PXM (Proximity). +method SKIPPED: Test 28, Skipping test for non-existent object method _PXM. method -method Test 28 of 201: Test _CCA (Cache Coherency Attribute). -method SKIPPED: Test 28, Skipping test for non-existent object +method Test 29 of 202: Test _CCA (Cache Coherency Attribute). +method SKIPPED: Test 29, Skipping test for non-existent object method _CCA. method -method Test 29 of 201: Test _EDL (Eject Device List). -method SKIPPED: Test 29, Skipping test for non-existent object +method Test 30 of 202: Test _EDL (Eject Device List). +method SKIPPED: Test 30, Skipping test for non-existent object method _EDL. method -method Test 30 of 201: Test _EJD (Ejection Dependent Device). -method SKIPPED: Test 30, Skipping test for non-existent object +method Test 31 of 202: Test _EJD (Ejection Dependent Device). +method SKIPPED: Test 31, Skipping test for non-existent object method _EJD. method -method Test 31 of 201: Test _EJ0 (Eject). -method SKIPPED: Test 31, Skipping test for non-existent object +method Test 32 of 202: Test _EJ0 (Eject). +method SKIPPED: Test 32, Skipping test for non-existent object method _EJ0. method -method Test 32 of 201: Test _EJ1 (Eject). -method SKIPPED: Test 32, Skipping test for non-existent object +method Test 33 of 202: Test _EJ1 (Eject). +method SKIPPED: Test 33, Skipping test for non-existent object method _EJ1. method -method Test 33 of 201: Test _EJ2 (Eject). -method SKIPPED: Test 33, Skipping test for non-existent object +method Test 34 of 202: Test _EJ2 (Eject). +method SKIPPED: Test 34, Skipping test for non-existent object method _EJ2. method -method Test 34 of 201: Test _EJ3 (Eject). -method SKIPPED: Test 34, Skipping test for non-existent object +method Test 35 of 202: Test _EJ3 (Eject). +method SKIPPED: Test 35, Skipping test for non-existent object method _EJ3. method -method Test 35 of 201: Test _EJ4 (Eject). -method SKIPPED: Test 35, Skipping test for non-existent object +method Test 36 of 202: Test _EJ4 (Eject). +method SKIPPED: Test 36, Skipping test for non-existent object method _EJ4. method -method Test 36 of 201: Test _LCK (Lock). -method SKIPPED: Test 36, Skipping test for non-existent object +method Test 37 of 202: Test _LCK (Lock). +method SKIPPED: Test 37, Skipping test for non-existent object method _LCK. method -method Test 37 of 201: Test _RMV (Remove). -method PASSED: Test 37, \_SB_.PCI0.RP03.PXSX._RMV correctly +method Test 38 of 202: Test _RMV (Remove). +method PASSED: Test 38, \_SB_.PCI0.RP03.PXSX._RMV correctly method returned sane looking value 0x00000001. method -method Test 38 of 201: Test _STA (Status). -method PASSED: Test 38, \_SB_.PCI0.PEGP.VGA_._STA correctly +method Test 39 of 202: Test _STA (Status). +method PASSED: Test 39, \_SB_.PCI0.PEGP.VGA_._STA correctly method returned sane looking value 0x0000000f. -method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKA._STA correctly +method PASSED: Test 39, \_SB_.PCI0.LPCB.LNKA._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKB._STA correctly +method PASSED: Test 39, \_SB_.PCI0.LPCB.LNKB._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKC._STA correctly +method PASSED: Test 39, \_SB_.PCI0.LPCB.LNKC._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKD._STA correctly +method PASSED: Test 39, \_SB_.PCI0.LPCB.LNKD._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKE._STA correctly +method PASSED: Test 39, \_SB_.PCI0.LPCB.LNKE._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKF._STA correctly +method PASSED: Test 39, \_SB_.PCI0.LPCB.LNKF._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKG._STA correctly +method PASSED: Test 39, \_SB_.PCI0.LPCB.LNKG._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKH._STA correctly +method PASSED: Test 39, \_SB_.PCI0.LPCB.LNKH._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 38, \_SB_.PCI0.LPCB.HPET._STA correctly +method PASSED: Test 39, \_SB_.PCI0.LPCB.HPET._STA correctly method returned sane looking value 0x00000000. -method PASSED: Test 38, \_SB_.PCI0.LPCB.BAT1._STA correctly +method PASSED: Test 39, \_SB_.PCI0.LPCB.BAT1._STA correctly method returned sane looking value 0x0000001f. method -method Test 39 of 201: Test _DEP (Operational Region +method Test 40 of 202: Test _DEP (Operational Region method Dependencies). -method SKIPPED: Test 39, Skipping test for non-existent object +method SKIPPED: Test 40, Skipping test for non-existent object method _DEP. method -method Test 40 of 201: Test _FIT (Firmware Interface Table). -method SKIPPED: Test 40, Skipping test for non-existent object +method Test 41 of 202: Test _FIT (Firmware Interface Table). +method SKIPPED: Test 41, Skipping test for non-existent object method _FIT. method -method Test 41 of 201: Test _BDN (BIOS Dock Name). -method SKIPPED: Test 41, Skipping test for non-existent object +method Test 42 of 202: Test _BDN (BIOS Dock Name). +method SKIPPED: Test 42, Skipping test for non-existent object method _BDN. method -method Test 42 of 201: Test _BBN (Base Bus Number). -method SKIPPED: Test 42, Skipping test for non-existent object +method Test 43 of 202: Test _BBN (Base Bus Number). +method SKIPPED: Test 43, Skipping test for non-existent object method _BBN. method -method Test 43 of 201: Test _DCK (Dock). -method SKIPPED: Test 43, Skipping test for non-existent object +method Test 44 of 202: Test _DCK (Dock). +method SKIPPED: Test 44, Skipping test for non-existent object method _DCK. method -method Test 44 of 201: Test _INI (Initialize). -method PASSED: Test 44, \_SB_._INI returned no values as +method Test 45 of 202: Test _INI (Initialize). +method PASSED: Test 45, \_SB_._INI returned no values as method expected. method -method Test 45 of 201: Test _GLK (Global Lock). -method SKIPPED: Test 45, Skipping test for non-existent object +method Test 46 of 202: Test _GLK (Global Lock). +method SKIPPED: Test 46, Skipping test for non-existent object method _GLK. method -method Test 46 of 201: Test _SEG (Segment). -method SKIPPED: Test 46, Skipping test for non-existent object +method Test 47 of 202: Test _SEG (Segment). +method SKIPPED: Test 47, Skipping test for non-existent object method _SEG. method -method Test 47 of 201: Test _LSI (Label Storage Information). -method SKIPPED: Test 47, Skipping test for non-existent object +method Test 48 of 202: Test _LSI (Label Storage Information). +method SKIPPED: Test 48, Skipping test for non-existent object method _LSI. method -method Test 48 of 201: Test _OFF (Set resource off). -method SKIPPED: Test 48, Skipping test for non-existent object +method Test 49 of 202: Test _OFF (Set resource off). +method SKIPPED: Test 49, Skipping test for non-existent object method _OFF. method -method Test 49 of 201: Test _ON_ (Set resource on). -method SKIPPED: Test 49, Skipping test for non-existent object +method Test 50 of 202: Test _ON_ (Set resource on). +method SKIPPED: Test 50, Skipping test for non-existent object method _ON_. method -method Test 50 of 201: Test _DSW (Device Sleep Wake). -method SKIPPED: Test 50, Skipping test for non-existent object +method Test 51 of 202: Test _DSW (Device Sleep Wake). +method SKIPPED: Test 51, Skipping test for non-existent object method _DSW. method -method Test 51 of 201: Test _IRC (In Rush Current). -method SKIPPED: Test 51, Skipping test for non-existent object +method Test 52 of 202: Test _IRC (In Rush Current). +method SKIPPED: Test 52, Skipping test for non-existent object method _IRC. method -method Test 52 of 201: Test _PRE (Power Resources for +method Test 53 of 202: Test _PRE (Power Resources for method Enumeration). -method SKIPPED: Test 52, Skipping test for non-existent object +method SKIPPED: Test 53, Skipping test for non-existent object method _PRE. method -method Test 53 of 201: Test _PR0 (Power Resources for D0). -method SKIPPED: Test 53, Skipping test for non-existent object +method Test 54 of 202: Test _PR0 (Power Resources for D0). +method SKIPPED: Test 54, Skipping test for non-existent object method _PR0. method -method Test 54 of 201: Test _PR1 (Power Resources for D1). -method SKIPPED: Test 54, Skipping test for non-existent object +method Test 55 of 202: Test _PR1 (Power Resources for D1). +method SKIPPED: Test 55, Skipping test for non-existent object method _PR1. method -method Test 55 of 201: Test _PR2 (Power Resources for D2). -method SKIPPED: Test 55, Skipping test for non-existent object +method Test 56 of 202: Test _PR2 (Power Resources for D2). +method SKIPPED: Test 56, Skipping test for non-existent object method _PR2. method -method Test 56 of 201: Test _PR3 (Power Resources for D3). -method SKIPPED: Test 56, Skipping test for non-existent object +method Test 57 of 202: Test _PR3 (Power Resources for D3). +method SKIPPED: Test 57, Skipping test for non-existent object method _PR3. method -method Test 57 of 201: Test _PRW (Power Resources for Wake). -method PASSED: Test 57, \_SB_.PCI0.HDEF._PRW correctly returned a +method Test 58 of 202: Test _PRW (Power Resources for Wake). +method PASSED: Test 58, \_SB_.PCI0.HDEF._PRW correctly returned a method sane looking package. -method PASSED: Test 57, \_SB_.PCI0.RP03.PXSX._PRW correctly +method PASSED: Test 58, \_SB_.PCI0.RP03.PXSX._PRW correctly method returned a sane looking package. -method PASSED: Test 57, \_SB_.PCI0.RP04.PXSX._PRW correctly +method PASSED: Test 58, \_SB_.PCI0.RP04.PXSX._PRW correctly method returned a sane looking package. -method PASSED: Test 57, \_SB_.PCI0.USB1._PRW correctly returned a +method PASSED: Test 58, \_SB_.PCI0.USB1._PRW correctly returned a method sane looking package. -method PASSED: Test 57, \_SB_.PCI0.USB2._PRW correctly returned a +method PASSED: Test 58, \_SB_.PCI0.USB2._PRW correctly returned a method sane looking package. -method PASSED: Test 57, \_SB_.PCI0.USB3._PRW correctly returned a +method PASSED: Test 58, \_SB_.PCI0.USB3._PRW correctly returned a method sane looking package. -method PASSED: Test 57, \_SB_.PCI0.USB4._PRW correctly returned a +method PASSED: Test 58, \_SB_.PCI0.USB4._PRW correctly returned a method sane looking package. -method PASSED: Test 57, \_SB_.PCI0.EHC1._PRW correctly returned a +method PASSED: Test 58, \_SB_.PCI0.EHC1._PRW correctly returned a method sane looking package. -method PASSED: Test 57, \_SB_.PCI0.EHC2._PRW correctly returned a +method PASSED: Test 58, \_SB_.PCI0.EHC2._PRW correctly returned a method sane looking package. method -method Test 58 of 201: Test _PS0 (Power State 0). -method PASSED: Test 58, \_SB_.PCI0.PEGP.VGA_._PS0 returned no +method Test 59 of 202: Test _PS0 (Power State 0). +method PASSED: Test 59, \_SB_.PCI0.PEGP.VGA_._PS0 returned no method values as expected. -method PASSED: Test 58, \_PS0 returned no values as expected. +method PASSED: Test 59, \_PS0 returned no values as expected. method -method Test 59 of 201: Test _PS1 (Power State 1). -method PASSED: Test 59, \_SB_.PCI0.PEGP.VGA_._PS1 returned no +method Test 60 of 202: Test _PS1 (Power State 1). +method PASSED: Test 60, \_SB_.PCI0.PEGP.VGA_._PS1 returned no method values as expected. method -method Test 60 of 201: Test _PS2 (Power State 2). -method SKIPPED: Test 60, Skipping test for non-existent object +method Test 61 of 202: Test _PS2 (Power State 2). +method SKIPPED: Test 61, Skipping test for non-existent object method _PS2. method -method Test 61 of 201: Test _PS3 (Power State 3). -method PASSED: Test 61, \_SB_.PCI0.PEGP.VGA_._PS3 returned no +method Test 62 of 202: Test _PS3 (Power State 3). +method PASSED: Test 62, \_SB_.PCI0.PEGP.VGA_._PS3 returned no method values as expected. -method PASSED: Test 61, \_PS3 returned no values as expected. +method PASSED: Test 62, \_PS3 returned no values as expected. method -method Test 62 of 201: Test _PSC (Power State Current). -method PASSED: Test 62, \_SB_.PCI0.PEGP.VGA_._PSC correctly +method Test 63 of 202: Test _PSC (Power State Current). +method PASSED: Test 63, \_SB_.PCI0.PEGP.VGA_._PSC correctly method returned an integer. -method PASSED: Test 62, \_PSC correctly returned an integer. +method PASSED: Test 63, \_PSC correctly returned an integer. method -method Test 63 of 201: Test _PSE (Power State for Enumeration). -method SKIPPED: Test 63, Skipping test for non-existent object +method Test 64 of 202: Test _PSE (Power State for Enumeration). +method SKIPPED: Test 64, Skipping test for non-existent object method _PSE. method -method Test 64 of 201: Test _PSW (Power State Wake). -method PASSED: Test 64, \_SB_.PCI0.USB1._PSW returned no values +method Test 65 of 202: Test _PSW (Power State Wake). +method PASSED: Test 65, \_SB_.PCI0.USB1._PSW returned no values method as expected. -method PASSED: Test 64, \_SB_.PCI0.USB2._PSW returned no values +method PASSED: Test 65, \_SB_.PCI0.USB2._PSW returned no values method as expected. -method PASSED: Test 64, \_SB_.PCI0.USB3._PSW returned no values +method PASSED: Test 65, \_SB_.PCI0.USB3._PSW returned no values method as expected. -method PASSED: Test 64, \_SB_.PCI0.USB4._PSW returned no values +method PASSED: Test 65, \_SB_.PCI0.USB4._PSW returned no values method as expected. -method PASSED: Test 64, \_SB_.PCI0.USB5._PSW returned no values +method PASSED: Test 65, \_SB_.PCI0.USB5._PSW returned no values method as expected. method -method Test 65 of 201: Test _S1D (S1 Device State). -method SKIPPED: Test 65, Skipping test for non-existent object +method Test 66 of 202: Test _S1D (S1 Device State). +method SKIPPED: Test 66, Skipping test for non-existent object method _S1D. method -method Test 66 of 201: Test _S2D (S2 Device State). -method SKIPPED: Test 66, Skipping test for non-existent object +method Test 67 of 202: Test _S2D (S2 Device State). +method SKIPPED: Test 67, Skipping test for non-existent object method _S2D. method -method Test 67 of 201: Test _S3D (S3 Device State). -method PASSED: Test 67, \_SB_.PCI0._S3D correctly returned an +method Test 68 of 202: Test _S3D (S3 Device State). +method PASSED: Test 68, \_SB_.PCI0._S3D correctly returned an method integer. -method PASSED: Test 67, \_SB_.PCI0.USB1._S3D correctly returned +method PASSED: Test 68, \_SB_.PCI0.USB1._S3D correctly returned method an integer. -method PASSED: Test 67, \_SB_.PCI0.USB2._S3D correctly returned +method PASSED: Test 68, \_SB_.PCI0.USB2._S3D correctly returned method an integer. -method PASSED: Test 67, \_SB_.PCI0.USB3._S3D correctly returned +method PASSED: Test 68, \_SB_.PCI0.USB3._S3D correctly returned method an integer. -method PASSED: Test 67, \_SB_.PCI0.USB4._S3D correctly returned +method PASSED: Test 68, \_SB_.PCI0.USB4._S3D correctly returned method an integer. -method PASSED: Test 67, \_SB_.PCI0.USB5._S3D correctly returned +method PASSED: Test 68, \_SB_.PCI0.USB5._S3D correctly returned method an integer. -method PASSED: Test 67, \_SB_.PCI0.EHC1._S3D correctly returned +method PASSED: Test 68, \_SB_.PCI0.EHC1._S3D correctly returned method an integer. -method PASSED: Test 67, \_SB_.PCI0.EHC2._S3D correctly returned +method PASSED: Test 68, \_SB_.PCI0.EHC2._S3D correctly returned method an integer. method -method Test 68 of 201: Test _S4D (S4 Device State). -method PASSED: Test 68, \_SB_.PCI0._S4D correctly returned an +method Test 69 of 202: Test _S4D (S4 Device State). +method PASSED: Test 69, \_SB_.PCI0._S4D correctly returned an method integer. -method PASSED: Test 68, \_SB_.PCI0.USB1._S4D correctly returned +method PASSED: Test 69, \_SB_.PCI0.USB1._S4D correctly returned method an integer. -method PASSED: Test 68, \_SB_.PCI0.USB2._S4D correctly returned +method PASSED: Test 69, \_SB_.PCI0.USB2._S4D correctly returned method an integer. -method PASSED: Test 68, \_SB_.PCI0.USB3._S4D correctly returned +method PASSED: Test 69, \_SB_.PCI0.USB3._S4D correctly returned method an integer. -method PASSED: Test 68, \_SB_.PCI0.USB4._S4D correctly returned +method PASSED: Test 69, \_SB_.PCI0.USB4._S4D correctly returned method an integer. -method PASSED: Test 68, \_SB_.PCI0.USB5._S4D correctly returned +method PASSED: Test 69, \_SB_.PCI0.USB5._S4D correctly returned method an integer. -method PASSED: Test 68, \_SB_.PCI0.EHC1._S4D correctly returned +method PASSED: Test 69, \_SB_.PCI0.EHC1._S4D correctly returned method an integer. -method PASSED: Test 68, \_SB_.PCI0.EHC2._S4D correctly returned +method PASSED: Test 69, \_SB_.PCI0.EHC2._S4D correctly returned method an integer. method -method Test 69 of 201: Test _S0W (S0 Device Wake State). -method SKIPPED: Test 69, Skipping test for non-existent object +method Test 70 of 202: Test _S0W (S0 Device Wake State). +method SKIPPED: Test 70, Skipping test for non-existent object method _S0W. method -method Test 70 of 201: Test _S1W (S1 Device Wake State). -method SKIPPED: Test 70, Skipping test for non-existent object +method Test 71 of 202: Test _S1W (S1 Device Wake State). +method SKIPPED: Test 71, Skipping test for non-existent object method _S1W. method -method Test 71 of 201: Test _S2W (S2 Device Wake State). -method SKIPPED: Test 71, Skipping test for non-existent object +method Test 72 of 202: Test _S2W (S2 Device Wake State). +method SKIPPED: Test 72, Skipping test for non-existent object method _S2W. method -method Test 72 of 201: Test _S3W (S3 Device Wake State). -method SKIPPED: Test 72, Skipping test for non-existent object +method Test 73 of 202: Test _S3W (S3 Device Wake State). +method SKIPPED: Test 73, Skipping test for non-existent object method _S3W. method -method Test 73 of 201: Test _S4W (S4 Device Wake State). -method SKIPPED: Test 73, Skipping test for non-existent object +method Test 74 of 202: Test _S4W (S4 Device Wake State). +method SKIPPED: Test 74, Skipping test for non-existent object method _S4W. method -method Test 74 of 201: Test _RST (Device Reset). -method SKIPPED: Test 74, Skipping test for non-existent object +method Test 75 of 202: Test _RST (Device Reset). +method SKIPPED: Test 75, Skipping test for non-existent object method _RST. method -method Test 75 of 201: Test _PRR (Power Resource for Reset). -method SKIPPED: Test 75, Skipping test for non-existent object +method Test 76 of 202: Test _PRR (Power Resource for Reset). +method SKIPPED: Test 76, Skipping test for non-existent object method _PRR. method -method Test 76 of 201: Test _S0_ (S0 System State). +method Test 77 of 202: Test _S0_ (S0 System State). method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 -method PASSED: Test 76, \_S0_ correctly returned a sane looking +method PASSED: Test 77, \_S0_ correctly returned a sane looking method package. method -method Test 77 of 201: Test _S1_ (S1 System State). -method SKIPPED: Test 77, Skipping test for non-existent object +method Test 78 of 202: Test _S1_ (S1 System State). +method SKIPPED: Test 78, Skipping test for non-existent object method _S1_. method -method Test 78 of 201: Test _S2_ (S2 System State). -method SKIPPED: Test 78, Skipping test for non-existent object +method Test 79 of 202: Test _S2_ (S2 System State). +method SKIPPED: Test 79, Skipping test for non-existent object method _S2_. method -method Test 79 of 201: Test _S3_ (S3 System State). +method Test 80 of 202: Test _S3_ (S3 System State). method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 -method PASSED: Test 79, \_S3_ correctly returned a sane looking +method PASSED: Test 80, \_S3_ correctly returned a sane looking method package. method -method Test 80 of 201: Test _S4_ (S4 System State). +method Test 81 of 202: Test _S4_ (S4 System State). method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 -method PASSED: Test 80, \_S4_ correctly returned a sane looking +method PASSED: Test 81, \_S4_ correctly returned a sane looking method package. method -method Test 81 of 201: Test _S5_ (S5 System State). +method Test 82 of 202: Test _S5_ (S5 System State). method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 -method PASSED: Test 81, \_S5_ correctly returned a sane looking +method PASSED: Test 82, \_S5_ correctly returned a sane looking method package. method -method Test 82 of 201: Test _SWS (System Wake Source). -method SKIPPED: Test 82, Skipping test for non-existent object +method Test 83 of 202: Test _SWS (System Wake Source). +method SKIPPED: Test 83, Skipping test for non-existent object method _SWS. method -method Test 83 of 201: Test _PSS (Performance Supported States). -method SKIPPED: Test 83, Skipping test for non-existent object +method Test 84 of 202: Test _PSS (Performance Supported States). +method SKIPPED: Test 84, Skipping test for non-existent object method _PSS. method -method Test 84 of 201: Test _CPC (Continuous Performance +method Test 85 of 202: Test _CPC (Continuous Performance method Control). -method SKIPPED: Test 84, Skipping test for non-existent object +method SKIPPED: Test 85, Skipping test for non-existent object method _CPC. method -method Test 85 of 201: Test _CSD (C State Dependencies). -method SKIPPED: Test 85, Skipping test for non-existent object +method Test 86 of 202: Test _CSD (C State Dependencies). +method SKIPPED: Test 86, Skipping test for non-existent object method _CSD. method -method Test 86 of 201: Test _CST (C States). -method SKIPPED: Test 86, Skipping test for non-existent object +method Test 87 of 202: Test _CST (C States). +method SKIPPED: Test 87, Skipping test for non-existent object method _CST. method -method Test 87 of 201: Test _PCT (Performance Control). -method SKIPPED: Test 87, Skipping test for non-existent object +method Test 88 of 202: Test _PCT (Performance Control). +method SKIPPED: Test 88, Skipping test for non-existent object method _PCT. method -method Test 88 of 201: Test _PDL (P-State Depth Limit). -method SKIPPED: Test 88, Skipping test for non-existent object +method Test 89 of 202: Test _PDL (P-State Depth Limit). +method SKIPPED: Test 89, Skipping test for non-existent object method _PDL. method -method Test 89 of 201: Test _PPC (Performance Present +method Test 90 of 202: Test _PPC (Performance Present method Capabilities). -method SKIPPED: Test 89, Skipping test for non-existent object +method SKIPPED: Test 90, Skipping test for non-existent object method _PPC. method -method Test 90 of 201: Test _PPE (Polling for Platform Error). -method SKIPPED: Test 90, Skipping test for non-existent object +method Test 91 of 202: Test _PPE (Polling for Platform Error). +method SKIPPED: Test 91, Skipping test for non-existent object method _PPE. method -method Test 91 of 201: Test _PSD (Power State Dependencies). -method SKIPPED: Test 91, Skipping test for non-existent object +method Test 92 of 202: Test _PSD (Power State Dependencies). +method SKIPPED: Test 92, Skipping test for non-existent object method _PSD. method -method Test 92 of 201: Test _PTC (Processor Throttling Control). -method PASSED: Test 92, \_PR_.CPU0._PTC correctly returned a sane +method Test 93 of 202: Test _PTC (Processor Throttling Control). +method PASSED: Test 93, \_PR_.CPU0._PTC correctly returned a sane method looking package. -method PASSED: Test 92, \_PR_.CPU1._PTC correctly returned a sane +method PASSED: Test 93, \_PR_.CPU1._PTC correctly returned a sane method looking package. method -method Test 93 of 201: Test _TDL (T-State Depth Limit). -method SKIPPED: Test 93, Skipping test for non-existent object +method Test 94 of 202: Test _TDL (T-State Depth Limit). +method SKIPPED: Test 94, Skipping test for non-existent object method _TDL. method -method Test 94 of 201: Test _TPC (Throttling Present +method Test 95 of 202: Test _TPC (Throttling Present method Capabilities). -method PASSED: Test 94, \_PR_.CPU0._TPC correctly returned an +method PASSED: Test 95, \_PR_.CPU0._TPC correctly returned an method integer. -method PASSED: Test 94, \_PR_.CPU1._TPC correctly returned an +method PASSED: Test 95, \_PR_.CPU1._TPC correctly returned an method integer. method -method Test 95 of 201: Test _TSD (Throttling State Dependencies). -method PASSED: Test 95, \_PR_.CPU0._TSD correctly returned a sane +method Test 96 of 202: Test _TSD (Throttling State Dependencies). +method PASSED: Test 96, \_PR_.CPU0._TSD correctly returned a sane method looking package. -method PASSED: Test 95, \_PR_.CPU1._TSD correctly returned a sane +method PASSED: Test 96, \_PR_.CPU1._TSD correctly returned a sane method looking package. method -method Test 96 of 201: Test _TSS (Throttling Supported States). +method Test 97 of 202: Test _TSS (Throttling Supported States). method \_PR_.CPU0._TSS values: method T-State CPU Power Latency Control Status method Freq (mW) (usecs) @@ -646,7 +650,7 @@ method 4 50% 500 0 0c 00 method 5 38% 375 0 0b 00 method 6 25% 250 0 0a 00 method 7 13% 125 0 09 00 -method PASSED: Test 96, \_PR_.CPU0._TSS correctly returned a sane +method PASSED: Test 97, \_PR_.CPU0._TSS correctly returned a sane method looking package. method \_PR_.CPU1._TSS values: method T-State CPU Power Latency Control Status @@ -659,657 +663,658 @@ method 4 50% 500 0 0c 00 method 5 38% 375 0 0b 00 method 6 25% 250 0 0a 00 method 7 13% 125 0 09 00 -method PASSED: Test 96, \_PR_.CPU1._TSS correctly returned a sane +method PASSED: Test 97, \_PR_.CPU1._TSS correctly returned a sane method looking package. method -method Test 97 of 201: Test _LPI (Low Power Idle States). -method SKIPPED: Test 97, Skipping test for non-existent object +method Test 98 of 202: Test _LPI (Low Power Idle States). +method SKIPPED: Test 98, Skipping test for non-existent object method _LPI. method -method Test 98 of 201: Test _RDI (Resource Dependencies for +method Test 99 of 202: Test _RDI (Resource Dependencies for method Idle). -method SKIPPED: Test 98, Skipping test for non-existent object +method SKIPPED: Test 99, Skipping test for non-existent object method _RDI. method -method Test 99 of 201: Test _PUR (Processor Utilization Request). -method SKIPPED: Test 99, Skipping test for non-existent object +method Test 100 of 202: Test _PUR (Processor Utilization +method Request). +method SKIPPED: Test 100, Skipping test for non-existent object method _PUR. method -method Test 100 of 201: Test _MSG (Message). -method SKIPPED: Test 100, Skipping test for non-existent object +method Test 101 of 202: Test _MSG (Message). +method SKIPPED: Test 101, Skipping test for non-existent object method _MSG. method -method Test 101 of 201: Test _SST (System Status). -method SKIPPED: Test 101, Skipping test for non-existent object +method Test 102 of 202: Test _SST (System Status). +method SKIPPED: Test 102, Skipping test for non-existent object method _SST. method -method Test 102 of 201: Test _ALC (Ambient Light Colour +method Test 103 of 202: Test _ALC (Ambient Light Colour method Chromaticity). -method SKIPPED: Test 102, Skipping test for non-existent object +method SKIPPED: Test 103, Skipping test for non-existent object method _ALC. method -method Test 103 of 201: Test _ALI (Ambient Light Illuminance). -method SKIPPED: Test 103, Skipping test for non-existent object +method Test 104 of 202: Test _ALI (Ambient Light Illuminance). +method SKIPPED: Test 104, Skipping test for non-existent object method _ALI. method -method Test 104 of 201: Test _ALT (Ambient Light Temperature). -method SKIPPED: Test 104, Skipping test for non-existent object +method Test 105 of 202: Test _ALT (Ambient Light Temperature). +method SKIPPED: Test 105, Skipping test for non-existent object method _ALT. method -method Test 105 of 201: Test _ALP (Ambient Light Polling). -method SKIPPED: Test 105, Skipping test for non-existent object +method Test 106 of 202: Test _ALP (Ambient Light Polling). +method SKIPPED: Test 106, Skipping test for non-existent object method _ALP. method -method Test 106 of 201: Test _ALR (Ambient Light Response). -method SKIPPED: Test 106, Skipping test for non-existent object +method Test 107 of 202: Test _ALR (Ambient Light Response). +method SKIPPED: Test 107, Skipping test for non-existent object method _ALR. method -method Test 107 of 201: Test _LID (Lid Status). -method PASSED: Test 107, \_SB_.LID0._LID correctly returned an +method Test 108 of 202: Test _LID (Lid Status). +method PASSED: Test 108, \_SB_.LID0._LID correctly returned an method integer. method -method Test 108 of 201: Test _GTF (Get Task File). -method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly +method Test 109 of 202: Test _GTF (Get Task File). +method PASSED: Test 109, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly method returned a sane looking buffer. -method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly +method PASSED: Test 109, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly method returned a sane looking buffer. -method PASSED: Test 108, \_SB_.PCI0.SATA.PRT0._GTF correctly +method PASSED: Test 109, \_SB_.PCI0.SATA.PRT0._GTF correctly method returned a sane looking buffer. -method PASSED: Test 108, \_SB_.PCI0.SATA.PRT1._GTF correctly +method PASSED: Test 109, \_SB_.PCI0.SATA.PRT1._GTF correctly method returned a sane looking buffer. -method PASSED: Test 108, \_SB_.PCI0.SATA.PRT2._GTF correctly +method PASSED: Test 109, \_SB_.PCI0.SATA.PRT2._GTF correctly method returned a sane looking buffer. method -method Test 109 of 201: Test _GTM (Get Timing Mode). -method PASSED: Test 109, \_SB_.PCI0.PATA.PRID._GTM correctly +method Test 110 of 202: Test _GTM (Get Timing Mode). +method PASSED: Test 110, \_SB_.PCI0.PATA.PRID._GTM correctly method returned a sane looking buffer. method -method Test 110 of 201: Test _MBM (Memory Bandwidth Monitoring +method Test 111 of 202: Test _MBM (Memory Bandwidth Monitoring method Data). -method SKIPPED: Test 110, Skipping test for non-existent object +method SKIPPED: Test 111, Skipping test for non-existent object method _MBM. method -method Test 111 of 201: Test _UPC (USB Port Capabilities). -method SKIPPED: Test 111, Skipping test for non-existent object +method Test 112 of 202: Test _UPC (USB Port Capabilities). +method SKIPPED: Test 112, Skipping test for non-existent object method _UPC. method -method Test 112 of 201: Test _UPD (User Presence Detect). -method SKIPPED: Test 112, Skipping test for non-existent object +method Test 113 of 202: Test _UPD (User Presence Detect). +method SKIPPED: Test 113, Skipping test for non-existent object method _UPD. method -method Test 113 of 201: Test _UPP (User Presence Polling). -method SKIPPED: Test 113, Skipping test for non-existent object +method Test 114 of 202: Test _UPP (User Presence Polling). +method SKIPPED: Test 114, Skipping test for non-existent object method _UPP. method -method Test 114 of 201: Test _GCP (Get Capabilities). -method SKIPPED: Test 114, Skipping test for non-existent object +method Test 115 of 202: Test _GCP (Get Capabilities). +method SKIPPED: Test 115, Skipping test for non-existent object method _GCP. method -method Test 115 of 201: Test _GRT (Get Real Time). -method SKIPPED: Test 115, Skipping test for non-existent object +method Test 116 of 202: Test _GRT (Get Real Time). +method SKIPPED: Test 116, Skipping test for non-existent object method _GRT. method -method Test 116 of 201: Test _GWS (Get Wake Status). -method SKIPPED: Test 116, Skipping test for non-existent object +method Test 117 of 202: Test _GWS (Get Wake Status). +method SKIPPED: Test 117, Skipping test for non-existent object method _GWS. method -method Test 117 of 201: Test _CWS (Clear Wake Status). -method SKIPPED: Test 117, Skipping test for non-existent object +method Test 118 of 202: Test _CWS (Clear Wake Status). +method SKIPPED: Test 118, Skipping test for non-existent object method _CWS. method -method Test 118 of 201: Test _SRT (Set Real Time). -method SKIPPED: Test 118, Skipping test for non-existent object +method Test 119 of 202: Test _SRT (Set Real Time). +method SKIPPED: Test 119, Skipping test for non-existent object method _SRT. method -method Test 119 of 201: Test _STP (Set Expired Timer Wake +method Test 120 of 202: Test _STP (Set Expired Timer Wake method Policy). -method SKIPPED: Test 119, Skipping test for non-existent object +method SKIPPED: Test 120, Skipping test for non-existent object method _STP. method -method Test 120 of 201: Test _STV (Set Timer Value). -method SKIPPED: Test 120, Skipping test for non-existent object +method Test 121 of 202: Test _STV (Set Timer Value). +method SKIPPED: Test 121, Skipping test for non-existent object method _STV. method -method Test 121 of 201: Test _TIP (Expired Timer Wake Policy). -method SKIPPED: Test 121, Skipping test for non-existent object +method Test 122 of 202: Test _TIP (Expired Timer Wake Policy). +method SKIPPED: Test 122, Skipping test for non-existent object method _TIP. method -method Test 122 of 201: Test _TIV (Timer Values). -method SKIPPED: Test 122, Skipping test for non-existent object +method Test 123 of 202: Test _TIV (Timer Values). +method SKIPPED: Test 123, Skipping test for non-existent object method _TIV. method -method Test 123 of 201: Test _NBS (NVDIMM Boot Status). -method SKIPPED: Test 123, Skipping test for non-existent object +method Test 124 of 202: Test _NBS (NVDIMM Boot Status). +method SKIPPED: Test 124, Skipping test for non-existent object method _NBS. method -method Test 124 of 201: Test _NCH (NVDIMM Current Health +method Test 125 of 202: Test _NCH (NVDIMM Current Health method Information). -method SKIPPED: Test 124, Skipping test for non-existent object +method SKIPPED: Test 125, Skipping test for non-existent object method _NCH. method -method Test 125 of 201: Test _NIC (NVDIMM Health Error Injection +method Test 126 of 202: Test _NIC (NVDIMM Health Error Injection method Capabilities). -method SKIPPED: Test 125, Skipping test for non-existent object +method SKIPPED: Test 126, Skipping test for non-existent object method _NIC. method -method Test 126 of 201: Test _NIH (NVDIMM Inject/Clear Health +method Test 127 of 202: Test _NIH (NVDIMM Inject/Clear Health method Errors). -method SKIPPED: Test 126, Skipping test for non-existent object +method SKIPPED: Test 127, Skipping test for non-existent object method _NIH. method -method Test 127 of 201: Test _NIG (NVDIMM Inject Health Error +method Test 128 of 202: Test _NIG (NVDIMM Inject Health Error method Status). -method SKIPPED: Test 127, Skipping test for non-existent object +method SKIPPED: Test 128, Skipping test for non-existent object method _NIG. method -method Test 128 of 201: Test _SBS (Smart Battery Subsystem). -method SKIPPED: Test 128, Skipping test for non-existent object +method Test 129 of 202: Test _SBS (Smart Battery Subsystem). +method SKIPPED: Test 129, Skipping test for non-existent object method _SBS. method -method Test 129 of 201: Test _BCT (Battery Charge Time). -method SKIPPED: Test 129, Skipping test for non-existent object +method Test 130 of 202: Test _BCT (Battery Charge Time). +method SKIPPED: Test 130, Skipping test for non-existent object method _BCT. method -method Test 130 of 201: Test _BIF (Battery Information). -method PASSED: Test 130, \_SB_.PCI0.LPCB.BAT1._BIF correctly +method Test 131 of 202: Test _BIF (Battery Information). +method PASSED: Test 131, \_SB_.PCI0.LPCB.BAT1._BIF correctly method returned a sane looking package. method -method Test 131 of 201: Test _BIX (Battery Information Extended). -method SKIPPED: Test 131, Skipping test for non-existent object +method Test 132 of 202: Test _BIX (Battery Information Extended). +method SKIPPED: Test 132, Skipping test for non-existent object method _BIX. method -method Test 132 of 201: Test _BMA (Battery Measurement +method Test 133 of 202: Test _BMA (Battery Measurement method Averaging). -method SKIPPED: Test 132, Skipping test for non-existent object +method SKIPPED: Test 133, Skipping test for non-existent object method _BMA. method -method Test 133 of 201: Test _BMC (Battery Maintenance Control). -method SKIPPED: Test 133, Skipping test for non-existent object +method Test 134 of 202: Test _BMC (Battery Maintenance Control). +method SKIPPED: Test 134, Skipping test for non-existent object method _BMC. method -method Test 134 of 201: Test _BMD (Battery Maintenance Data). -method SKIPPED: Test 134, Skipping test for non-existent object +method Test 135 of 202: Test _BMD (Battery Maintenance Data). +method SKIPPED: Test 135, Skipping test for non-existent object method _BMD. method -method Test 135 of 201: Test _BMS (Battery Measurement Sampling +method Test 136 of 202: Test _BMS (Battery Measurement Sampling method Time). -method SKIPPED: Test 135, Skipping test for non-existent object +method SKIPPED: Test 136, Skipping test for non-existent object method _BMS. method -method Test 136 of 201: Test _BST (Battery Status). -method PASSED: Test 136, \_SB_.PCI0.LPCB.BAT1._BST correctly +method Test 137 of 202: Test _BST (Battery Status). +method PASSED: Test 137, \_SB_.PCI0.LPCB.BAT1._BST correctly method returned a sane looking package. method -method Test 137 of 201: Test _BTP (Battery Trip Point). -method SKIPPED: Test 137, Skipping test for non-existent object +method Test 138 of 202: Test _BTP (Battery Trip Point). +method SKIPPED: Test 138, Skipping test for non-existent object method _BTP. method -method Test 138 of 201: Test _BTH (Battery Throttle Limit). -method SKIPPED: Test 138, Skipping test for non-existent object +method Test 139 of 202: Test _BTH (Battery Throttle Limit). +method SKIPPED: Test 139, Skipping test for non-existent object method _BTH. method -method Test 139 of 201: Test _BTM (Battery Time). -method SKIPPED: Test 139, Skipping test for non-existent object +method Test 140 of 202: Test _BTM (Battery Time). +method SKIPPED: Test 140, Skipping test for non-existent object method _BTM. method -method Test 140 of 201: Test _PCL (Power Consumer List). -method PASSED: Test 140, \_SB_.PCI0.LPCB.ACAD._PCL returned a +method Test 141 of 202: Test _PCL (Power Consumer List). +method PASSED: Test 141, \_SB_.PCI0.LPCB.ACAD._PCL returned a method sane package of 1 references. -method PASSED: Test 140, \_SB_.PCI0.LPCB.BAT1._PCL returned a +method PASSED: Test 141, \_SB_.PCI0.LPCB.BAT1._PCL returned a method sane package of 1 references. method -method Test 141 of 201: Test _PIF (Power Source Information). -method SKIPPED: Test 141, Skipping test for non-existent object +method Test 142 of 202: Test _PIF (Power Source Information). +method SKIPPED: Test 142, Skipping test for non-existent object method _PIF. method -method Test 142 of 201: Test _PRL (Power Source Redundancy List). -method SKIPPED: Test 142, Skipping test for non-existent object +method Test 143 of 202: Test _PRL (Power Source Redundancy List). +method SKIPPED: Test 143, Skipping test for non-existent object method _PRL. method -method Test 143 of 201: Test _PSR (Power Source). -method PASSED: Test 143, \_SB_.PCI0.LPCB.ACAD._PSR correctly +method Test 144 of 202: Test _PSR (Power Source). +method PASSED: Test 144, \_SB_.PCI0.LPCB.ACAD._PSR correctly method returned sane looking value 0x00000000. method -method Test 144 of 201: Test _GAI (Get Averaging Level). -method SKIPPED: Test 144, Skipping test for non-existent object +method Test 145 of 202: Test _GAI (Get Averaging Level). +method SKIPPED: Test 145, Skipping test for non-existent object method _GAI. method -method Test 145 of 201: Test _GHL (Get Harware Limit). -method SKIPPED: Test 145, Skipping test for non-existent object +method Test 146 of 202: Test _GHL (Get Harware Limit). +method SKIPPED: Test 146, Skipping test for non-existent object method _GHL. method -method Test 146 of 201: Test _PMC (Power Meter Capabilities). -method SKIPPED: Test 146, Skipping test for non-existent object +method Test 147 of 202: Test _PMC (Power Meter Capabilities). +method SKIPPED: Test 147, Skipping test for non-existent object method _PMC. method -method Test 147 of 201: Test _PMD (Power Meter Devices). -method SKIPPED: Test 147, Skipping test for non-existent object +method Test 148 of 202: Test _PMD (Power Meter Devices). +method SKIPPED: Test 148, Skipping test for non-existent object method _PMD. method -method Test 148 of 201: Test _PMM (Power Meter Measurement). -method SKIPPED: Test 148, Skipping test for non-existent object +method Test 149 of 202: Test _PMM (Power Meter Measurement). +method SKIPPED: Test 149, Skipping test for non-existent object method _PMM. method -method Test 149 of 201: Test _WPC (Wireless Power Calibration). -method SKIPPED: Test 149, Skipping test for non-existent object +method Test 150 of 202: Test _WPC (Wireless Power Calibration). +method SKIPPED: Test 150, Skipping test for non-existent object method _WPC. method -method Test 150 of 201: Test _WPP (Wireless Power Polling). -method SKIPPED: Test 150, Skipping test for non-existent object +method Test 151 of 202: Test _WPP (Wireless Power Polling). +method SKIPPED: Test 151, Skipping test for non-existent object method _WPP. method -method Test 151 of 201: Test _FIF (Fan Information). -method SKIPPED: Test 151, Skipping test for non-existent object +method Test 152 of 202: Test _FIF (Fan Information). +method SKIPPED: Test 152, Skipping test for non-existent object method _FIF. method -method Test 152 of 201: Test _FPS (Fan Performance States). -method SKIPPED: Test 152, Skipping test for non-existent object +method Test 153 of 202: Test _FPS (Fan Performance States). +method SKIPPED: Test 153, Skipping test for non-existent object method _FPS. method -method Test 153 of 201: Test _FSL (Fan Set Level). -method SKIPPED: Test 153, Skipping test for non-existent object +method Test 154 of 202: Test _FSL (Fan Set Level). +method SKIPPED: Test 154, Skipping test for non-existent object method _FSL. method -method Test 154 of 201: Test _FST (Fan Status). -method SKIPPED: Test 154, Skipping test for non-existent object +method Test 155 of 202: Test _FST (Fan Status). +method SKIPPED: Test 155, Skipping test for non-existent object method _FST. method -method Test 155 of 201: Test _ACx (Active Cooling). -method SKIPPED: Test 155, Skipping test for non-existent object +method Test 156 of 202: Test _ACx (Active Cooling). +method SKIPPED: Test 156, Skipping test for non-existent object method _AC0. method -method SKIPPED: Test 155, Skipping test for non-existent object +method SKIPPED: Test 156, Skipping test for non-existent object method _AC1. method -method SKIPPED: Test 155, Skipping test for non-existent object +method SKIPPED: Test 156, Skipping test for non-existent object method _AC2. method -method SKIPPED: Test 155, Skipping test for non-existent object +method SKIPPED: Test 156, Skipping test for non-existent object method _AC3. method -method SKIPPED: Test 155, Skipping test for non-existent object +method SKIPPED: Test 156, Skipping test for non-existent object method _AC4. method -method SKIPPED: Test 155, Skipping test for non-existent object +method SKIPPED: Test 156, Skipping test for non-existent object method _AC5. method -method SKIPPED: Test 155, Skipping test for non-existent object +method SKIPPED: Test 156, Skipping test for non-existent object method _AC6. method -method SKIPPED: Test 155, Skipping test for non-existent object +method SKIPPED: Test 156, Skipping test for non-existent object method _AC7. method -method SKIPPED: Test 155, Skipping test for non-existent object +method SKIPPED: Test 156, Skipping test for non-existent object method _AC8. method -method SKIPPED: Test 155, Skipping test for non-existent object +method SKIPPED: Test 156, Skipping test for non-existent object method _AC9. method method -method Test 156 of 201: Test _ART (Active Cooling Relationship +method Test 157 of 202: Test _ART (Active Cooling Relationship method Table). -method SKIPPED: Test 156, Skipping test for non-existent object +method SKIPPED: Test 157, Skipping test for non-existent object method _ART. method -method Test 157 of 201: Test _ALx (Active List). -method SKIPPED: Test 157, Skipping test for non-existent object +method Test 158 of 202: Test _ALx (Active List). +method SKIPPED: Test 158, Skipping test for non-existent object method _AL0. method -method SKIPPED: Test 157, Skipping test for non-existent object +method SKIPPED: Test 158, Skipping test for non-existent object method _AL1. method -method SKIPPED: Test 157, Skipping test for non-existent object +method SKIPPED: Test 158, Skipping test for non-existent object method _AL2. method -method SKIPPED: Test 157, Skipping test for non-existent object +method SKIPPED: Test 158, Skipping test for non-existent object method _AL3. method -method SKIPPED: Test 157, Skipping test for non-existent object +method SKIPPED: Test 158, Skipping test for non-existent object method _AL4. method -method SKIPPED: Test 157, Skipping test for non-existent object +method SKIPPED: Test 158, Skipping test for non-existent object method _AL5. method -method SKIPPED: Test 157, Skipping test for non-existent object +method SKIPPED: Test 158, Skipping test for non-existent object method _AL6. method -method SKIPPED: Test 157, Skipping test for non-existent object +method SKIPPED: Test 158, Skipping test for non-existent object method _AL7. method -method SKIPPED: Test 157, Skipping test for non-existent object +method SKIPPED: Test 158, Skipping test for non-existent object method _AL8. method -method SKIPPED: Test 157, Skipping test for non-existent object +method SKIPPED: Test 158, Skipping test for non-existent object method _AL9. method method -method Test 158 of 201: Test _CRT (Critical Trip Point). -method SKIPPED: Test 158, Skipping test for non-existent object +method Test 159 of 202: Test _CRT (Critical Trip Point). +method SKIPPED: Test 159, Skipping test for non-existent object method _CRT. method -method Test 159 of 201: Test _CR3 (Warm/Standby Temperature). -method SKIPPED: Test 159, Skipping test for non-existent object +method Test 160 of 202: Test _CR3 (Warm/Standby Temperature). +method SKIPPED: Test 160, Skipping test for non-existent object method _CR3. method -method Test 160 of 201: Test _DTI (Device Temperature +method Test 161 of 202: Test _DTI (Device Temperature method Indication). -method SKIPPED: Test 160, Skipping test for non-existent object +method SKIPPED: Test 161, Skipping test for non-existent object method _DTI. method -method Test 161 of 201: Test _HOT (Hot Temperature). -method SKIPPED: Test 161, Skipping test for non-existent object +method Test 162 of 202: Test _HOT (Hot Temperature). +method SKIPPED: Test 162, Skipping test for non-existent object method _HOT. method -method Test 162 of 201: Test _MTL (Minimum Throttle Limit). -method SKIPPED: Test 162, Skipping test for non-existent object +method Test 163 of 202: Test _MTL (Minimum Throttle Limit). +method SKIPPED: Test 163, Skipping test for non-existent object method _MTL. method -method Test 163 of 201: Test _NTT (Notification Temp Threshold). -method SKIPPED: Test 163, Skipping test for non-existent object +method Test 164 of 202: Test _NTT (Notification Temp Threshold). +method SKIPPED: Test 164, Skipping test for non-existent object method _NTT. method -method Test 164 of 201: Test _PSL (Passive List). -method SKIPPED: Test 164, Skipping test for non-existent object +method Test 165 of 202: Test _PSL (Passive List). +method SKIPPED: Test 165, Skipping test for non-existent object method _PSL. method -method Test 165 of 201: Test _PSV (Passive Temp). -method SKIPPED: Test 165, Skipping test for non-existent object +method Test 166 of 202: Test _PSV (Passive Temp). +method SKIPPED: Test 166, Skipping test for non-existent object method _PSV. method -method Test 166 of 201: Test _RTV (Relative Temp Values). -method SKIPPED: Test 166, Skipping test for non-existent object +method Test 167 of 202: Test _RTV (Relative Temp Values). +method SKIPPED: Test 167, Skipping test for non-existent object method _RTV. method -method Test 167 of 201: Test _SCP (Set Cooling Policy). -method SKIPPED: Test 167, Skipping test for non-existent object +method Test 168 of 202: Test _SCP (Set Cooling Policy). +method SKIPPED: Test 168, Skipping test for non-existent object method _DTI. method -method Test 168 of 201: Test _TC1 (Thermal Constant 1). -method SKIPPED: Test 168, Skipping test for non-existent object +method Test 169 of 202: Test _TC1 (Thermal Constant 1). +method SKIPPED: Test 169, Skipping test for non-existent object method _TC1. method -method Test 169 of 201: Test _TC2 (Thermal Constant 2). -method SKIPPED: Test 169, Skipping test for non-existent object +method Test 170 of 202: Test _TC2 (Thermal Constant 2). +method SKIPPED: Test 170, Skipping test for non-existent object method _TC2. method -method Test 170 of 201: Test _TFP (Thermal fast Sampling Period). -method SKIPPED: Test 170, Skipping test for non-existent object +method Test 171 of 202: Test _TFP (Thermal fast Sampling Period). +method SKIPPED: Test 171, Skipping test for non-existent object method _TFP. method -method Test 171 of 201: Test _TMP (Thermal Zone Current Temp). -method SKIPPED: Test 171, Skipping test for non-existent object +method Test 172 of 202: Test _TMP (Thermal Zone Current Temp). +method SKIPPED: Test 172, Skipping test for non-existent object method _TMP. method -method Test 172 of 201: Test _TPT (Trip Point Temperature). -method SKIPPED: Test 172, Skipping test for non-existent object +method Test 173 of 202: Test _TPT (Trip Point Temperature). +method SKIPPED: Test 173, Skipping test for non-existent object method _TPT. method -method Test 173 of 201: Test _TRT (Thermal Relationship Table). -method SKIPPED: Test 173, Skipping test for non-existent object +method Test 174 of 202: Test _TRT (Thermal Relationship Table). +method SKIPPED: Test 174, Skipping test for non-existent object method _TRT. method -method Test 174 of 201: Test _TSN (Thermal Sensor Device). -method SKIPPED: Test 174, Skipping test for non-existent object +method Test 175 of 202: Test _TSN (Thermal Sensor Device). +method SKIPPED: Test 175, Skipping test for non-existent object method _TSN. method -method Test 175 of 201: Test _TSP (Thermal Sampling Period). -method SKIPPED: Test 175, Skipping test for non-existent object +method Test 176 of 202: Test _TSP (Thermal Sampling Period). +method SKIPPED: Test 176, Skipping test for non-existent object method _TSP. method -method Test 176 of 201: Test _TST (Temperature Sensor Threshold). -method SKIPPED: Test 176, Skipping test for non-existent object +method Test 177 of 202: Test _TST (Temperature Sensor Threshold). +method SKIPPED: Test 177, Skipping test for non-existent object method _TST. method -method Test 177 of 201: Test _TZD (Thermal Zone Devices). -method SKIPPED: Test 177, Skipping test for non-existent object +method Test 178 of 202: Test _TZD (Thermal Zone Devices). +method SKIPPED: Test 178, Skipping test for non-existent object method _TZD. method -method Test 178 of 201: Test _TZM (Thermal Zone member). -method SKIPPED: Test 178, Skipping test for non-existent object +method Test 179 of 202: Test _TZM (Thermal Zone member). +method SKIPPED: Test 179, Skipping test for non-existent object method _TZM. method -method Test 179 of 201: Test _TZP (Thermal Zone Polling). -method SKIPPED: Test 179, Skipping test for non-existent object +method Test 180 of 202: Test _TZP (Thermal Zone Polling). +method SKIPPED: Test 180, Skipping test for non-existent object method _TZP. method -method Test 180 of 201: Test _GPE (General Purpose Events). -method PASSED: Test 180, \_SB_.PCI0.LPCB.EC0_._GPE returned an +method Test 181 of 202: Test _GPE (General Purpose Events). +method PASSED: Test 181, \_SB_.PCI0.LPCB.EC0_._GPE returned an method integer 0x0000001c method -method Test 181 of 201: Test _EC_ (EC Offset Query). -method SKIPPED: Test 181, Skipping test for non-existent object +method Test 182 of 202: Test _EC_ (EC Offset Query). +method SKIPPED: Test 182, Skipping test for non-existent object method _EC_. method -method Test 182 of 201: Test _PTS (Prepare to Sleep). +method Test 183 of 202: Test _PTS (Prepare to Sleep). method Test _PTS(3). -method PASSED: Test 182, \_PTS returned no values as expected. +method PASSED: Test 183, \_PTS returned no values as expected. method method Test _PTS(4). -method PASSED: Test 182, \_PTS returned no values as expected. +method PASSED: Test 183, \_PTS returned no values as expected. method method Test _PTS(5). -method PASSED: Test 182, \_PTS returned no values as expected. +method PASSED: Test 183, \_PTS returned no values as expected. method method -method Test 183 of 201: Test _TTS (Transition to State). -method SKIPPED: Test 183, Optional control method _TTS does not +method Test 184 of 202: Test _TTS (Transition to State). +method SKIPPED: Test 184, Optional control method _TTS does not method exist. method -method Test 184 of 201: Test _WAK (System Wake). +method Test 185 of 202: Test _WAK (System Wake). method Test _WAK(3) System Wake, State S3. -method PASSED: Test 184, \_WAK correctly returned a sane looking +method PASSED: Test 185, \_WAK correctly returned a sane looking method package. method method Test _WAK(4) System Wake, State S4. -method PASSED: Test 184, \_WAK correctly returned a sane looking +method PASSED: Test 185, \_WAK correctly returned a sane looking method package. method method Test _WAK(5) System Wake, State S5. -method PASSED: Test 184, \_WAK correctly returned a sane looking +method PASSED: Test 185, \_WAK correctly returned a sane looking method package. method method -method Test 185 of 201: Test _ADR (Return Unique ID for Device). -method PASSED: Test 185, \_SB_.PCI0.MCHC._ADR correctly returned +method Test 186 of 202: Test _ADR (Return Unique ID for Device). +method PASSED: Test 186, \_SB_.PCI0.MCHC._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.PEGP._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.PEGP._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.GFX0._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.GFX0._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD01._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD01._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD02._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD02._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD04._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD04._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD05._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD05._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.HDEF._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.HDEF._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.RP01._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.RP01._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.RP01.PXSX._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.RP01.PXSX._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.RP02._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.RP02._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.RP02.PXSX._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.RP02.PXSX._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.RP03._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.RP03._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.RP03.PXSX._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.RP03.PXSX._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.RP04._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.RP04._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.RP04.PXSX._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.RP04.PXSX._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.RP05._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.RP05._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.RP05.PXSX._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.RP05.PXSX._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.RP06._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.RP06._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.RP06.PXSX._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.RP06.PXSX._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.USB1._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.USB1._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.USB2._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.USB2._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.USB3._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.USB3._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.USB4._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.USB4._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.USB5._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.USB5._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC1._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.EHC1._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC1.HUB7._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC2._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.EHC2._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC2.HUB7._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC2.HUB7._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.PCIB._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.PCIB._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.LPCB._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.LPCB._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.PATA._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.PATA._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.PATA.PRID._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.PATA.PRID._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.SATA._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.SATA._ADR correctly returned method an integer. -method PASSED: Test 185, \_SB_.PCI0.SATA.PRT0._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.SATA.PRT0._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.SATA.PRT1._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.SATA.PRT1._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.SATA.PRT2._ADR correctly +method PASSED: Test 186, \_SB_.PCI0.SATA.PRT2._ADR correctly method returned an integer. -method PASSED: Test 185, \_SB_.PCI0.SBUS._ADR correctly returned +method PASSED: Test 186, \_SB_.PCI0.SBUS._ADR correctly returned method an integer. method -method Test 186 of 201: Test _BCL (Query List of Brightness +method Test 187 of 202: Test _BCL (Query List of Brightness method Control Levels Supported). method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: method Level on full power : 70 method Level on battery power: 40 method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned +method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned method a sane package of 10 integers. method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL: method Level on full power : 70 method Level on battery power: 40 method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._BCL returned a +method PASSED: Test 187, \_SB_.PCI0.GFX0.DD03._BCL returned a method sane package of 10 integers. method -method Test 187 of 201: Test _BCM (Set Brightness Level). -method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned +method Test 188 of 202: Test _BCM (Set Brightness Level). +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned method no values as expected. -method PASSED: Test 187, \_SB_.PCI0.GFX0.DD03._BCM returned no +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD03._BCM returned no method values as expected. method -method Test 188 of 201: Test _BQC (Brightness Query Current +method Test 189 of 202: Test _BQC (Brightness Query Current method Level). -method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly +method PASSED: Test 189, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly method returned an integer. -method PASSED: Test 188, \_SB_.PCI0.GFX0.DD03._BQC correctly +method PASSED: Test 189, \_SB_.PCI0.GFX0.DD03._BQC correctly method returned an integer. method -method Test 189 of 201: Test _DCS (Return the Status of Output +method Test 190 of 202: Test _DCS (Return the Status of Output method Device). -method PASSED: Test 189, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly method returned an integer. -method PASSED: Test 189, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly method returned an integer. -method PASSED: Test 189, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly method returned an integer. -method PASSED: Test 189, \_SB_.PCI0.GFX0.DD01._DCS correctly +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD01._DCS correctly method returned an integer. -method PASSED: Test 189, \_SB_.PCI0.GFX0.DD02._DCS correctly +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD02._DCS correctly method returned an integer. -method PASSED: Test 189, \_SB_.PCI0.GFX0.DD03._DCS correctly +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD03._DCS correctly method returned an integer. -method PASSED: Test 189, \_SB_.PCI0.GFX0.DD04._DCS correctly +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD04._DCS correctly method returned an integer. -method PASSED: Test 189, \_SB_.PCI0.GFX0.DD05._DCS correctly +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD05._DCS correctly method returned an integer. method -method Test 190 of 201: Test _DDC (Return the EDID for this +method Test 191 of 202: Test _DDC (Return the EDID for this method Device). -method SKIPPED: Test 190, Skipping test for non-existent object +method SKIPPED: Test 191, Skipping test for non-existent object method _DDC. method -method Test 191 of 201: Test _DSS (Device Set State). -method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned +method Test 192 of 202: Test _DSS (Device Set State). +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned method no values as expected. -method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned method no values as expected. -method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned method no values as expected. -method PASSED: Test 191, \_SB_.PCI0.GFX0.DD01._DSS returned no +method PASSED: Test 192, \_SB_.PCI0.GFX0.DD01._DSS returned no method values as expected. -method PASSED: Test 191, \_SB_.PCI0.GFX0.DD02._DSS returned no +method PASSED: Test 192, \_SB_.PCI0.GFX0.DD02._DSS returned no method values as expected. -method PASSED: Test 191, \_SB_.PCI0.GFX0.DD03._DSS returned no +method PASSED: Test 192, \_SB_.PCI0.GFX0.DD03._DSS returned no method values as expected. -method PASSED: Test 191, \_SB_.PCI0.GFX0.DD04._DSS returned no +method PASSED: Test 192, \_SB_.PCI0.GFX0.DD04._DSS returned no method values as expected. -method PASSED: Test 191, \_SB_.PCI0.GFX0.DD05._DSS returned no +method PASSED: Test 192, \_SB_.PCI0.GFX0.DD05._DSS returned no method values as expected. method -method Test 192 of 201: Test _DGS (Query Graphics State). -method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly +method Test 193 of 202: Test _DGS (Query Graphics State). +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0.DD01._DGS correctly +method PASSED: Test 193, \_SB_.PCI0.GFX0.DD01._DGS correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0.DD02._DGS correctly +method PASSED: Test 193, \_SB_.PCI0.GFX0.DD02._DGS correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0.DD03._DGS correctly +method PASSED: Test 193, \_SB_.PCI0.GFX0.DD03._DGS correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0.DD04._DGS correctly +method PASSED: Test 193, \_SB_.PCI0.GFX0.DD04._DGS correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0.DD05._DGS correctly +method PASSED: Test 193, \_SB_.PCI0.GFX0.DD05._DGS correctly method returned an integer. method -method Test 193 of 201: Test _DOD (Enumerate All Devices Attached +method Test 194 of 202: Test _DOD (Enumerate All Devices Attached method to Display Adapter). method Device 0: method Instance: 0 @@ -1332,7 +1337,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni method BIOS can detect device: 0 method Non-VGA device: 0 method Head or pipe ID: 0 -method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_._DOD correctly +method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_._DOD correctly method returned a sane looking package. method Device 0: method Instance: 0 @@ -1369,45 +1374,45 @@ method Type of display: 0 (Other) method BIOS can detect device: 1 method Non-VGA device: 0 method Head or pipe ID: 0 -method PASSED: Test 193, \_SB_.PCI0.GFX0._DOD correctly returned +method PASSED: Test 194, \_SB_.PCI0.GFX0._DOD correctly returned method a sane looking package. method -method Test 194 of 201: Test _DOS (Enable/Disable Output +method Test 195 of 202: Test _DOS (Enable/Disable Output method Switching). -method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_._DOS returned no +method PASSED: Test 195, \_SB_.PCI0.PEGP.VGA_._DOS returned no method values as expected. -method PASSED: Test 194, \_SB_.PCI0.GFX0._DOS returned no values +method PASSED: Test 195, \_SB_.PCI0.GFX0._DOS returned no values method as expected. method -method Test 195 of 201: Test _GPD (Get POST Device). -method SKIPPED: Test 195, Skipping test for non-existent object +method Test 196 of 202: Test _GPD (Get POST Device). +method SKIPPED: Test 196, Skipping test for non-existent object method _GPD. method -method Test 196 of 201: Test _ROM (Get ROM Data). -method SKIPPED: Test 196, Skipping test for non-existent object +method Test 197 of 202: Test _ROM (Get ROM Data). +method SKIPPED: Test 197, Skipping test for non-existent object method _ROM. method -method Test 197 of 201: Test _SPD (Set POST Device). -method SKIPPED: Test 197, Skipping test for non-existent object +method Test 198 of 202: Test _SPD (Set POST Device). +method SKIPPED: Test 198, Skipping test for non-existent object method _SPD. method -method Test 198 of 201: Test _VPO (Video POST Options). -method SKIPPED: Test 198, Skipping test for non-existent object +method Test 199 of 202: Test _VPO (Video POST Options). +method SKIPPED: Test 199, Skipping test for non-existent object method _VPO. method -method Test 199 of 201: Test _CBA (Configuration Base Address). -method SKIPPED: Test 199, Skipping test for non-existent object +method Test 200 of 202: Test _CBA (Configuration Base Address). +method SKIPPED: Test 200, Skipping test for non-existent object method _CBA. method -method Test 200 of 201: Test _IFT (IPMI Interface Type). -method SKIPPED: Test 200, Skipping test for non-existent object +method Test 201 of 202: Test _IFT (IPMI Interface Type). +method SKIPPED: Test 201, Skipping test for non-existent object method _IFT. method -method Test 201 of 201: Test _SRV (IPMI Interface Revision). -method SKIPPED: Test 201, Skipping test for non-existent object +method Test 202 of 202: Test _SRV (IPMI Interface Revision). +method SKIPPED: Test 202, Skipping test for non-existent object method _SRV. method method ========================================================== -method 260 passed, 0 failed, 0 warning, 0 aborted, 172 skipped, 0 +method 260 passed, 0 failed, 0 warning, 0 aborted, 173 skipped, 0 method info only. method ==========================================================