Show patches with: Series = stdio-common: Formatted scanf input specifier tests       |    State = Action Required       |    Archived = No       |   17 patches
Patch Series A/F/R/T S/W/F Date Submitter Delegate State
[v2,17/17] stdio-common: Reject significand prefixes in scanf [BZ #12701] stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,16/17] stdio-common: Reject significand prefixes in scanf [BZ #12701] stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,15/17] stdio-common: Reject integer prefixes in scanf [BZ #12701] stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,14/17] stdio-common: Add tests for formatted vsscanf input specifiers stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,13/17] stdio-common: Add tests for formatted vfscanf input specifiers stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,12/17] stdio-common: Add tests for formatted vscanf input specifiers stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,11/17] stdio-common: Add tests for formatted sscanf input specifiers stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,10/17] stdio-common: Add tests for formatted fscanf input specifiers stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,09/17] stdio-common: Add scanf long double data for IBM 128-bit format stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,08/17] stdio-common: Add scanf long double data for IEEE 754 binary64 format stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,07/17] stdio-common: Add scanf long double data for Intel/Motorola 80-bit format stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,06/17] stdio-common: Add scanf long double data for IEEE 754 binary128 format stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,05/17] stdio-common: Add scanf double data for IEEE 754 binary64 format stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,04/17] stdio-common: Add scanf float data for IEEE 754 binary32 format stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,03/17] stdio-common: Add scanf integer data for LP64 targets stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,02/17] stdio-common: Add scanf integer data for ILP32 targets stdio-common: Formatted scanf input specifier tests - - - - --- 2025-03-01 Maciej W. Rozycki New
[v2,01/17] stdio-common: Add tests for formatted scanf input specifiers stdio-common: Formatted scanf input specifier tests - - 1 - --- 2025-03-01 Maciej W. Rozycki New