@@ -857,6 +857,17 @@ static void mxc_nand_command(struct mtd_info *mtd, unsigned command,
}
}
+/* Define some generic bad / good block scan pattern which are used
+ * while scanning a device for factory marked good / bad blocks. */
+static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
+
+static struct nand_bbt_descr smallpage_memorybased = {
+ .options = NAND_BBT_SCAN2NDPAGE,
+ .offs = 5,
+ .len = 1,
+ .pattern = scan_ff_pattern
+};
+
static int __init mxcnd_probe(struct platform_device *pdev)
{
struct nand_chip *this;
@@ -973,7 +984,10 @@ static int __init mxcnd_probe(struct platform_device *pdev)
goto escan;
}
- host->pagesize_2k = (mtd->writesize == 2048) ? 1 : 0;
+ if (mtd->writesize == 2048) {
+ host->pagesize_2k = 1;
+ this->badblock_pattern = &smallpage_memorybased;
+ }
if (this->ecc.mode == NAND_ECC_HW) {
switch (mtd->oobsize) {